OAB Authors only
The list is ordered by I.F. in decreasing direction.
Documents in archives:
9
- Author: Mazzoleni, F
1/1 pag.
-
Totals
- ∑Authors OAB/Tot.: 32 / 106
- Percentage OAB_Authors: 30.19%
- ∑citations: 38
- ∑I.F.: 10.62
- ∑ I.F. / n. publications: 1.18
1. PAPERS PUBLISHED
Scardia, M. , . . Ghigo, M.
2005, Monthly Notices of the Royal Astronomical Society, Volume 357, Issue 4, pp. 1255-1266.
Citations: 15
I.F.: 4.29
Citations/Authors: 2.14
. . . . Citterio, O. , . Pareschi, G. , Spiga, D. , . . . et al.
2005, Experimental Astronomy, Volume 20, Issue 1-3, pp. 405-412
Citations: 11
I.F.: 3
Citations/Authors: 1
Development of a prototype nickel optic for the
Constellation-X hard-x-ray telescope: III
. Basso, S. , . . Citterio, O. , . . . Ghigo, M. , . . . . . Pareschi, G. , . . Spiga, D. , et al.
2005, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II. Edited by Citterio, Oberto; O'Dell, Stephen L. Proceedings of the SPIE, Volume 5900, pp. 225-231 (2005).
Citations: 6
I.F.: 1.67
Citations/Authors: 0.33
Scardia, M. , . . Ghigo, M.
2005, Monthly Notices of the Royal Astronomical Society, Volume 362, Issue 3, pp. 1120-1120.
. . . . Citterio, O. , Ghigo, M. , . Pareschi, G. , . . . et al.
2005, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II. Edited by
Citterio, Oberto; O'Dell, Stephen L. Proceedings of the
SPIE, Volume 5900, pp. 258-265 (2005).
5. CONTRIBUTED PAPERS AT INTERNATIONAL MEETINGS
. Basso, S. , . . Citterio, O. , . . . Ghigo, M. , . . . . . Pareschi, G. , . . Spiga, D. , et al.
2005, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II. Edited by Citterio, Oberto; O'Dell, Stephen L. Proceedings of the SPIE, Volume 5900, pp. 225-231 (2005).
Citations: 6
I.F.: 1.67
Citations/Authors: 0.33
. . . Pareschi, G. , Citterio, O. , Ghigo, M. , . Spiga, D. , Basso, S. , . . . . . . . . . et al.
2005, American Astronomical Society Meeting 207, #12.12; Bulletin of the American Astronomical Society, Vol. 37, p.1172
7. TECHNICAL REPORTS
ESA Silicon Substrate Microroughness Chracterization
. . Spiga, D. , Pareschi, G. , Citterio, O.
2005, INAF/OAB Internal Technical Report 01/2005
X-ray and topographic characterization of a W/Si graded
multilayer coated mirror shell (n.333) at PANTER facility
(april 2005)
Spiga, D. , . . . . . Pareschi, G. , Citterio, O. , Basso, S. , . . et al.
2005, INAF/OAB Internal Report 08/05