Speckle observations with PISCO in Merate - I. Astrometric measurements of visual binaries in 2004

Scardia, M. , . . Ghigo, M.

2005, Monthly Notices of the Royal Astronomical Society, Volume 357, Issue 4, pp. 1255-1266.

Citations: 15     I.F.: 4.29        Citations/Authors: 2.14

The MPE X-ray test facility PANTER: Calibration of hard X-ray (15 50 kev) optics

. . . . Citterio, O. , . Pareschi, G. , Spiga, D. , . . . et al.

2005, Experimental Astronomy, Volume 20, Issue 1-3, pp. 405-412

Citations: 11     I.F.: 3        Citations/Authors: 1

Development of a prototype nickel optic for the Constellation-X hard-x-ray telescope: III

. Basso, S. , . . Citterio, O. , . . . Ghigo, M. , . . . . . Pareschi, G. , . . Spiga, D. , et al.

2005, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II. Edited by Citterio, Oberto; O'Dell, Stephen L. Proceedings of the SPIE, Volume 5900, pp. 225-231 (2005).

Citations: 6     I.F.: 1.67        Citations/Authors: 0.33

Erratum: Speckle observations with PISCO in Merate - I. Astrometric measurements of visual binaries in 2004

Scardia, M. , . . Ghigo, M.

2005, Monthly Notices of the Royal Astronomical Society, Volume 362, Issue 3, pp. 1120-1120.

Recent results on manufacturing of segmented x-ray mirrors with slumped glass

. . . . Citterio, O. , Ghigo, M. , . Pareschi, G. , . . . et al.

2005, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II. Edited by Citterio, Oberto; O'Dell, Stephen L. Proceedings of the SPIE, Volume 5900, pp. 258-265 (2005).

Development of a prototype nickel optic for the Constellation-X hard-x-ray telescope: III

. Basso, S. , . . Citterio, O. , . . . Ghigo, M. , . . . . . Pareschi, G. , . . Spiga, D. , et al.

2005, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II. Edited by Citterio, Oberto; O'Dell, Stephen L. Proceedings of the SPIE, Volume 5900, pp. 225-231 (2005).

Citations: 6     I.F.: 1.67        Citations/Authors: 0.33

Development of Prototype Nickel Optic for the Constellation-X Hard X-Ray Telescope

. . . Pareschi, G. , Citterio, O. , Ghigo, M. , . Spiga, D. , Basso, S. , . . . . . . . . . et al.

2005, American Astronomical Society Meeting 207, #12.12; Bulletin of the American Astronomical Society, Vol. 37, p.1172

ESA Silicon Substrate Microroughness Chracterization

. . Spiga, D. , Pareschi, G. , Citterio, O.

2005, INAF/OAB Internal Technical Report 01/2005

X-ray and topographic characterization of a W/Si graded multilayer coated mirror shell (n.333) at PANTER facility (april 2005)

Spiga, D. , . . . . . Pareschi, G. , Citterio, O. , Basso, S. , . . et al.

2005, INAF/OAB Internal Report 08/05