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Pubblication Year: [All years]   2002  2003  2004  2005  2006  2007  2008  2009  2010  2011  2012  2013  2014  2015  2016  2017  2018  2019  2020  2021  2022  2023  2024 
Tipology [All types]  Tech. report2 
interest field: [All fields]  Instrumental2 
Vernani, D. e coautori   : [ All authors ]  Basso, S  Canestrari, R  Citterio, O  Mazzoleni, F  Pareschi, G  Spiga, D  Valtolina, R  Vernani, D 

    OAB Authors only     The list is ordered by I.F. in decreasing direction.
Documents in archives: 2   -   Author: Vernani, D
1/1 pag.
    Totals
  • ∑Authors OAB/Tot.: 7 / 16
  • Percentage OAB_Authors: 43.75%
  • ∑citations: 0
  • ∑I.F.: 0
  • ∑ I.F. / n. publications: 0

7. TECHNICAL REPORTS

ESA Silicon Substrate Microroughness Chracterization

Vernani, D., Mazzoleni, F., Spiga, D. , Pareschi, G. , Citterio, O.

2005, INAF/OAB Internal Technical Report 01/2005
X-ray and topographic characterization of a W/Si graded multilayer coated mirror shell (n.333) at PANTER facility (april 2005)

Spiga, D. , Burkert, W., Hartner, G., Budau, B., Vernani, D., Canestrari, R., Pareschi, G. , Citterio, O. , Basso, S. , Mazzoleni, F., Valtolina, R., et al.

2005, INAF/OAB Internal Report 08/05