OAB Authors only
The list is ordered by I.F. in decreasing direction.
Documents in archives:
2
- Author: Vernani, D
1/1 pag.
-
Totals
- ∑Authors OAB/Tot.: 7 / 16
- Percentage OAB_Authors: 43.75%
- ∑citations: 0
- ∑I.F.: 0
- ∑ I.F. / n. publications: 0
7. TECHNICAL REPORTS
ESA Silicon Substrate Microroughness Chracterization
. . Spiga, D. , Pareschi, G. , Citterio, O.
2005, INAF/OAB Internal Technical Report 01/2005
X-ray and topographic characterization of a W/Si graded
multilayer coated mirror shell (n.333) at PANTER facility
(april 2005)
Spiga, D. , . . . . . Pareschi, G. , Citterio, O. , Basso, S. , . . et al.
2005, INAF/OAB Internal Report 08/05