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    Solo autori OAB     La lista e` ordinata per I.F. in senso decrescente.
Documenti in archivio: 13   -   Instrumental projects and technologies   -   Autore: Citterio, O
1/1 pag.
    Totals
  • ∑Authors OAB/Tot.: 57 / 267
  • Percentage OAB_Authors: 21.35%
  • ∑citations: 47
  • ∑I.F.: 9.01
  • ∑ I.F. / n. publications: 0.69

1. PAPERS PUBLISHED

. . . . . . . . . . . Campana, S. , Citterio, O. , Moretti, A. , . Tagliaferri, G. , . . . . . . . . et al.

2005, X-Ray and Gamma-Ray Instrumentation for Astronomy XIII. Edited by Flanagan, Kathryn A.; Siegmund, Oswald H. W. Proceedings of the SPIE, Volume 5165, pp. 201-216 (2004).
Citations: 37     I.F.: 6.17        Citations/Authors: 1.54

Tagliaferri, G. , Campana, S. , . Citterio, O. , Moretti, A. , Romano, P. , . . . . . . . . . . . . . . . . . . . . . et al.

2005, Il Nuovo Cimento C, vol. 28, Issue 4, p.857

. . . . Citterio, O. , Ghigo, M. , . Pareschi, G. , . . . et al.

2005, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II. Edited by Citterio, Oberto; O'Dell, Stephen L. Proceedings of the SPIE, Volume 5900, pp. 258-265 (2005).

3. INVITED PAPERS AT INTERNATIONAL MEETINGS

. . . . . . . . Citterio, O. , Pareschi, G. , Tagliaferri, G. , . . . . . L.

2005, [Proc. SPIE 5900, 59000P (2005)] published Thu Sep 8, 2005.

5. CONTRIBUTED PAPERS AT INTERNATIONAL MEETINGS

. Basso, S. , . . Citterio, O. , . . . Ghigo, M. , . . . . . Pareschi, G. , . . Spiga, D. , et al.

2005, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II. Edited by Citterio, Oberto; O'Dell, Stephen L. Proceedings of the SPIE, Volume 5900, pp. 225-231 (2005).
Citations: 6     I.F.: 1.67        Citations/Authors: 0.33

Pareschi, G. , Citterio, O. , Basso, S. , Ghigo, M. , . Spiga, D. , . . . . . . . . . . . et al.

2005, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II. Edited by Citterio, Oberto; O'Dell, Stephen L. Proceedings of the SPIE, Volume 5900, pp. 47-58 (2005).
Citations: 4     I.F.: 1.18        Citations/Authors: 0.24

. . . Pareschi, G. , Citterio, O. , Ghigo, M. , . Spiga, D. , Basso, S. , . . . . . . . . . et al.

2005, American Astronomical Society Meeting 207, #12.12; Bulletin of the American Astronomical Society, Vol. 37, p.1172

Romano, P. , . Campana, S. , . Moretti, A. , . . . . . . Citterio, O. , . . . . . . . . . . . . . . Tagliaferri, G. , . . et al.

2005, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XIV. Edited by Siegmund, Oswald H. W. Proceedings of the SPIE, Volume 5898, pp. 357-364 (2005).

Romano, P. , . Campana, S. , . Moretti, A. , . . . . . . Citterio, O. , . . . . . . . . . . . . . . Tagliaferri, G. , . . et al.

2005, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XIV. Edited by Siegmund, Oswald H. W. Proceedings of the SPIE, Volume 5898, pp. 357-364 (2005).

Moretti, Alberto , Campana, Sergio , . Romano, Patrizia , . . . . . . . Citterio, O. , . . . . . . . . . . . . . . . . Tagliaferri, G. , . . et al.

2005, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XIV. Edited by Siegmund, Oswald H. W. Proceedings of the SPIE, Volume 5898, pp. 348-356 (2005).

Moretti, A. , Campana, S. , . Romano, P. , . . . . . . . Citterio, O. , . . . . . . . . . . . . . . . . Tagliaferri, G. , . . et al.

2005, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XIV. Edited by Siegmund, Oswald H. W. Proceedings of the SPIE, Volume 5898, pp. 348-356 (2005).

7. TECHNICAL REPORTS

ESA Silicon Substrate Microroughness Chracterization

. . Spiga, D. , Pareschi, G. , Citterio, O.

2005, INAF/OAB Internal Technical Report 01/2005
X-ray and topographic characterization of a W/Si graded multilayer coated mirror shell (n.333) at PANTER facility (april 2005)

Spiga, D. , . . . . . Pareschi, G. , Citterio, O. , Basso, S. , . . et al.

2005, INAF/OAB Internal Report 08/05