immagine casa per indicare la Home page Ti trovi in: Home >> Ricerca  >> Archivio OAB immagine bandiera inglese immagine bandiera italiana
Cerca 
 
    Solo autori OAB     La lista e` ordinata per I.F. in senso decrescente.
Documenti in archivio: 6   -   Instrumental projects and technologies   -   Autore: Mazzoleni, F
1/1 pag.
    Totals
  • ∑Authors OAB/Tot.: 25 / 81
  • Percentage OAB_Authors: 30.86%
  • ∑citations: 12
  • ∑I.F.: 3.33
  • ∑ I.F. / n. publications: 0.56

1. PAPERS PUBLISHED

Development of a prototype nickel optic for the Constellation-X hard-x-ray telescope: III

Romaine, S., Basso, S. , Bruni, R., Burkert, W., Citterio, O. , Conti, G., Engelhaupt, D., Freyberg, M., Ghigo, M. , Gorenstein, P., Gubarev, M., et al.

2005, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II. Edited by Citterio, Oberto; O'Dell, Stephen L. Proceedings of the SPIE, Volume 5900, pp. 225-231 (2005).
Citations: 6     I.F.: 1.67        Citations/Authors: 0.33

Friedrich, P., Aschenbach, B., Braeuninger, H., Hasinger, G., Citterio, O. , Ghigo, M. , Mazzoleni, F., Pareschi, G. , Dinger, U., Egle, W., Matthes, A., et al.

2005, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II. Edited by Citterio, Oberto; O'Dell, Stephen L. Proceedings of the SPIE, Volume 5900, pp. 258-265 (2005).

5. CONTRIBUTED PAPERS AT INTERNATIONAL MEETINGS

Romaine, S., Basso, S. , Bruni, R., Burkert, W., Citterio, O. , Conti, G., Engelhaupt, D., Freyberg, M., Ghigo, M. , Gorenstein, P., Gubarev, M., et al.

2005, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II. Edited by Citterio, Oberto; O'Dell, Stephen L. Proceedings of the SPIE, Volume 5900, pp. 225-231 (2005).
Citations: 6     I.F.: 1.67        Citations/Authors: 0.33

Romaine, S., Gorenstein, P., Bruni, R., Pareschi, G. , Citterio, O. , Ghigo, M. , Mazzoleni, F., Spiga, D. , Basso, S. , Conti, G., Ramsey, B., et al.

2005, American Astronomical Society Meeting 207, #12.12; Bulletin of the American Astronomical Society, Vol. 37, p.1172

7. TECHNICAL REPORTS

ESA Silicon Substrate Microroughness Chracterization

Vernani, D., Mazzoleni, F., Spiga, D. , Pareschi, G. , Citterio, O.

2005, INAF/OAB Internal Technical Report 01/2005
X-ray and topographic characterization of a W/Si graded multilayer coated mirror shell (n.333) at PANTER facility (april 2005)

Spiga, D. , Burkert, W., Hartner, G., Budau, B., Vernani, D., Canestrari, R., Pareschi, G. , Citterio, O. , Basso, S. , Mazzoleni, F., Valtolina, R., et al.

2005, INAF/OAB Internal Report 08/05