Civitani, M. , Basso, S. , . Citterio, O. , . . . Ghigo, M. , . Pareschi, G. , . Proserpio, L. , Salmaso, B. , Sironi, G. , Spiga, D. , Tagliaferri, G. , . . . et al.
Ghigo, M. , Proserpio, L. , Basso, S. , Citterio, O. , Civitani, M. , Pareschi, G. , Salmaso, B. , Sironi, G. , Spiga, D. , Tagliaferri, G. , Vecchi, G. , . . . . . . . . . et al.
2013, Proceedings of the SPIE, Volume 8884, id. 88841Q 14 pp. (2013).
Proserpio, L. , Basso, S. , Civitani, M. , Citterio, O. , . Ghigo, M. , Pareschi, G. , Salmaso, B. , Spiga, D. , Tagliaferri, G.
2013, Memorie della Societa Astronomica Italiana, v.84, p.819 (2013)
7. TECHNICAL REPORTS
Fine-tuning of slumped AF32 glasses on a Zerodur K20 mould
Salmaso, B. , Spiga, D.
2013, INAF/OAB internal report 14/2013
IXO backup optics with slumped glasses: PANTER test of the
Proof of Concept #2 optic
Spiga, D. , Civitani, M. , Proserpio, L. , Salmaso, B. , Basso, S.
2013, INAF/OAB internal report 10/2013
IXO glasses cleaning procedure after slumping: removing
residuals affecting the high frequency region
Salmaso, B. , Bianco, A. , Proserpio, L. , Ghigo, M. , Spiga, D.
2013, INAF/OAB Internal report 01/2013
LTP profiles of AF32 glasses with FEA correction: a method
to remove spurious mid-frequency errors
Salmaso, B. , Basso, S. , Spiga, D.
2013, INAF/OAB internal report 12/2013
Profile and roughness metrology of slumped glasses for the
"IXO back-up optics" project
Spiga, D. , Proserpio, L. , Salmaso, B. , Ghigo, M. , . . . Basso, S. , Civitani, M. , . . Sironi, G. , . . . . . . . Pareschi, G. , Citterio, O. , Tagliaferri, G. , et al.