Since the beginning of X-ray Astronomy theoreticians have predicted that X-ray sources of most classes should be linearly polarized to a significat degree. The measurement of polarization would provide invaluable information on the inner regions of compact sources, adding two more parameters to the two already explored with spectrum and variability. Nothwithstanding this optimistic expectations the experimental efforts and the results have been so far very meagre. This is mainly due to the complexity and to the poor sensitivity of conventional techniques. The recently discovered technique of polarimetry based on the imaging of photoelectron tracks with a Micropattern Gas Chamber, allows for fully imaging, energy and time resolved Polarimetry, in the focal plane of X-ray optics. The increase in sensitivity is of at least two orders of magnitude. Moreover the instrument is compact and not dramatically affected by systematics. The speakers will present the further developments of this technique from the very beginning (around 2000) to nowadays including the recent implementation of large area, fast readout ASIC chips. They will discuss, as well, the potentialities, in terms of Astrophysical performances, of these devices when combined with X-ray telescopes in the context of realistic scenarios for future missions.