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Pubblication Year: [All years]   2002  2003  2004  2005  2006  2007  2008  2009  2010  2011  2012  2013  2014  2015  2016  2017  2018  2019  2020  2021  2022  2023  2024 
Tipology [All types]  Contr. inter. meet3  Published1 
interest field: [All fields]  Instrumental4 
Pelliciari, C. e coautori   : [ All authors ]  Basso, S  Ghigo, M  Giro, E  Pareschi, G  Pelliciari, C  Salmaso, B  Spiga, D  Tagliaferri, G  Vecchi, G 

    OAB Authors only     The list is ordered by I.F. in decreasing direction.
Documents in archives: 4   -   Instrumental projects and technologies   -   Author: Pelliciari, C
1/1 pag.
    Totals
  • ∑Authors OAB/Tot.: 26 / 62
  • Percentage OAB_Authors: 41.94%
  • ∑citations: 0
  • ∑I.F.: 0
  • ∑ I.F. / n. publications: 0

1. PAPERS PUBLISHED

Characterization of ADP crystals for soft x-ray optics of the Beam Expander Testing X-ray facility (BEaTriX)

Ferrari, C., Beretta, S., Salmaso, B. , Pareschi, G. , Tagliaferri, G. , Basso, S. , Spiga, D. , Pelliciari, C., Giro, E.

2019, Journal of Applied Crystallography, 52

5. CONTRIBUTED PAPERS AT INTERNATIONAL MEETINGS

BEaTriX (Beam Expander Testing X-ray facility) for testing ATHENAs SPO modules: advancement status

Salmaso, B. , Basso, S. , Ghigo, M. , Giro, E., Pareschi, G. , Spiga, D. , Tagliaferri, G. , Vecchi, G. , Pelliciari, C., Burwitz, V., Sanchez del Rio, M., et al.

2019, Proceedings of the SPIE, Volume 11180, id. 1118026 10 pp. (2019).
BEaTriX - the Beam Expander Testing X-ray facility for testing ATHENA's SPO modules: progress in the realization

Salmaso, B. , Basso, S. , Giro, E., Spiga, D. , Vecchi, G. , Ghigo, M. , Pareschi, G. , Tagliaferri, G. , Uslenghi, M., Fiorini, M., Paoletti, L., et al.

2019, Proceedings of the SPIE, Volume 11119, id. 111190N 15 pp. (2019).
pdf icon   Optical simulations for the laboratory-based, expanded and collimated X-ray beam facility BEaTriX

Spiga, D. , Salmaso, B. , Bavdaz, M., Pelliciari, C., Basso, S. , Burwitz, V., Ferreira, I., Ghigo, M. , Giro, E., Pareschi, G. , Sanchez del Rio, M., et al.

2019, Proc. SPIE 11110, Advances in Laboratory-based X-Ray Sources, Optics, and Applications VII, 111100E