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Tipology
[All types]
Tech. report9
Contr. inter. meet5
interest field:
[All fields]
Instrumental14
Spiga, D. e coautori
:
[ All authors ]
Basso, S
Civitani, M
Ghigo, M
Holyszko, J
Pareschi, G
Pariani, G
Salmaso, B
Spiga, D
Tagliaferri, G
Tayabaly, K
Vecchi, G
Vernani, D
-
Totals
- ∑Authors OAB/Tot.: 42 / 111
- Percentage OAB_Authors: 37.84%
- ∑citations: 2
- ∑I.F.: 0.43
- ∑ I.F. / n. publications: 0.03
5. CONTRIBUTED PAPERS AT INTERNATIONAL MEETINGS
Valsecchi, G., Marioni, F., Bianucci, G., Zocchi, F., Gallieni, D., Parodi, G., Ottolini, M., Collon, M., Civitani, M. , Pareschi, G. , Spiga, D. , et al.
Spiga, D. , Della Monica Ferreira, D., Shortt, B., Bavdaz, M., Bergback Knudsen, E., Bianucci, G., Christensen, F., Civitani, M. , Collon, M., Conconi, P., Fransen, S., et al.
Fused Silica segments: a possible solution for x-ray telescopes with very high
angular resolution like Lynx/XRS
Salmaso, B. , Basso, S. , Civitani, M. , Ghigo, M. , Holyszko, J., Spiga, D. , Vecchi, G. , Pareschi, G.
Hong, J., Romaine, S., Ramsey, B., Nittler, L., Gendreau, K., Spiga, D. , Elvis, M., Grindlay, J.
Bavdaz, M., Wille, E., Ayre, M., Ferreira, I., Shortt, B., Fransen, S., Collon, M.J., Vacanti, G., Barriere, N.M., Landgraf, B., Haneveld, J., et al.
7. TECHNICAL REPORTS
Spiga, D. , Pareschi, G. , Salmaso, B. , Tagliaferri, G.
Charged particle diverters for X-ray telescopes: the
magnetic field of a uniformly-magnetized wedge
Spiga, D.
Detecting the mitigation of fused silica roughening
after Ion Beam Figuring
Holyszko, J., Salmaso, B. , Ghigo, M. , Arcangeli, L., Passaretti, F., Spiga, D.
Spiga, D. , Burwitz, V.
Fused Silica thin segments for X-ray telescopes: status of the process at OAB.
Salmaso, B. , Basso, S. , Civitani, M. , Ghigo, M. , Pariani, G. , Spiga, D. , Vecchi, G. , Arcangeli, L., Ritucci, A., Rossi, M., Pareschi, G. , et al.
Salmaso, B. , Spiga, D.
Spiga, D. , Valsecchi, G., Marioni, F., Burwitz, V., Hartner, G.
Spiga, D. , Tagliaferri, G. , Pareschi, G. , Feroci, M., Santangelo, A.
X-ray scattering measurements of Fused Silica samples
after Ion Beam Figuring
Salmaso, B. , Spiga, D.
